Scanning Electron Microscope with EDX

With our scanning electron microscope Leo 440i with nitrogen-free EDX detector we offer the following services:

  • Surface examination with highest resolution and depth of field (SE detector)
  • element contrast images with backscattered electrons (BSE detector)
  • chemical analysis by means of EDX e.g., quantitative spot analysis
  • chemical element distribution by EDX qualitatively e.g., line scan and mapping as well as quantitatively in line scan
  • investigation of non-conductive material by sputtering with gold or C possible

With these examination methods we provide you with the exact surface images as well as the position and chemical nature of possible inclusions. Fracture patterns can be examined just as well as cross-section coatings and this at magnifications of up to 50,000 times.

Our website is using cookies

We use cookies to personalize content and ads, to be able to offer functions for social media and to analyze access to our website. We also share information about your use of our website with our social media, advertising and analytics partners. Our partners may combine this information with other data that you have provided to them or that they have collected as part of your use of the services.
Please note our privacy statement also. Our contact information can be found in the imprint. Information about the cookies we may use is listed on our cookie overview.