Materialography and analytics

You want to take a closer look at your material or penetrate deeper layers? We can do that for you:

With the help of our very well-equipped metallography laboratory, we prepare for you both classic metallographic sections, angled and thin sections for subsequent microscopic observation of your material. Our light microscope equipment allows a resolution of up to 1000x magnification in transmitted and reflected light, so that plastics, mineral materials, and composites can be characterized in addition to metallic materials. For even higher resolutions, we have a scanning electron microscope with EDX detector.

By means of magnetic inductive as well as eddy current based measuring methods we can also non-destructively determine layer thicknesses on your metallic components.

If you want to go deeper and need more information, we analyse the chemical composition of the sample material or its reaction products by energy dispersive X-ray analysis (EDX). We can also, for example, display diffusion profiles via lines cans or the element distribution in the material pictorially via element mappings.

In addition, we offer hardness measurements from HV0.01-HV30 as well as HBW1/10 for coatings, microstructural components, and base materials. Hardness measurements on plastics are carried out using Shore hardness testers (A and D). indentation force for coatings, structural components, and materials.


With our scanning electron microscope Leo 440i with nitrogen-free EDX detector we offer the following services

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Angle cross-section

This method is used for thin layers and enables the evaluation of layer thicknesses from approx. 0.5 µm.

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Thin cross-section technique

Technical thin cross-sections allow specimens to be examined even in transmitted light or in a combination of transmitted and reflected light

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